EDX8800E XRF SPECTROMETER

Item número.: 07
Descrição

EDX8800E absorbs all the advantages of EDX series and is additionally equipped with vacuum system, so that it expands testing scope, improves the detection limit and enhances the data stability.

 

Specifications

Measurable elements: Na-U

Element content: 1ppm-99.99%

Detection limit: 1ppm

Measurement time: 60-200s (adjustable)

PowerAC220±5V

Energy resolution: 129±5 eV

X-ray tube maximum output current: 1mA

Ultimate pressure6.7×10-2 Pa

Sample chamber size: 610*320*100(mm) (Without vacuum)/Φ100*h75(mm) (Vacuum)

Long-time working stability(subject to standard sample):±0.05%(high content) 

/±0.002%(micro-content)

Excellent repeatability(subject to standard sample):0.06%((high content)/±0.0025%(micro-content)

 

 

 

Revisão

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